ZIF connectors and semiconductor testing device and system using the same
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United States of America Patent
Stats
-
Aug 21, 2012
Grant Date -
Jul 1, 2010
app pub date -
Mar 28, 2009
filing date -
Dec 30, 2008
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A ZIF connector and a semiconductor testing device using the ZIF connectors are provided. The ZIF connector comprises a body portion and a clamping portion. The body portion is a print circuit board provided with circuit patterns, and further comprises a plurality of signal holes disposed on an upper part of the body portion for electrically connecting a plurality of corresponding signal cables, and a plurality of electrical terminals disposed on a lower part of the body portion and arranged on two lateral sides of the body portion for electrically connecting a plurality of corresponding electrical pads of a substrate. The circuit patterns are provided in the body portion to connect to the electrical terminals through the signal holes accordingly. The clamping portion is horizontally extended on one lateral side of the body portion for securing the ZIF connector in a connector board.
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