Sub-micron decal transfer lithography

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United States of America Patent

PATENT NO 8252191
APP PUB NO 20080190888A1
SERIAL NO

11911787

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Abstract

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The present invention provides a method of sub-micron decal transfer lithography. The method includes forming a first pattern in a surface of a first silicon-containing elastomer, bonding at least a portion of the first pattern to a substrate, and etching a portion of at least one of the first silicon-containing elastomer and the substrate.

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Patent Owner(s)

Patent OwnerAddress
DOW CORNING CORPORATIONMIDLAND STATE OF MICHIGAN UNITED STATES OF AMERICA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Heejoon, Ahn Seoul, KR 1 22
Nuzzo, Ralph Champaign, US 17 2988
Shim, Anne Plaistow, US 11 72

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