Methods of depositing a ruthenium film

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United States of America Patent

PATENT NO 8273408
APP PUB NO 20090104777A1
SERIAL NO

12250827

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Abstract

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Cyclical methods of depositing a ruthenium layer on a substrate are provided. In one process, initial or incubation cycles include supplying alternately and/or simultaneously a ruthenium precursor and an oxygen-source gas to deposit ruthenium oxide on the substrate. The ruthenium oxide deposited on the substrate is reduced to ruthenium, thereby forming a ruthenium layer. The oxygen-source gas may be oxygen gas (O2). The ruthenium oxide may be reduced by supplying a reducing agent, such as ammonia (NH3) gas. The methods provide a ruthenium layer having good adherence to an underlying high dielectric layer while providing good step coverage over structures on the substrate. After nucleation, subsequent deposition cycles can be altered to optimize speed and/or conformality rather than adherence.

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Patent Owner(s)

Patent OwnerAddress
ASM KOREA LTDYOUNGCHEON-DONG 63-11 DONGTANCHEOMDANSANEOP 1-RO HWASEONG-SI GYEONGGI-DO 18469

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Jong Su Cheonan-si, KR 68 1759
Park, Hyung Sang Seoul-si, KR 30 5154

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