Method for testing an electronics unit
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United States of America Patent
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Sep 25, 2012
Grant Date -
Jul 1, 2010
app pub date -
Oct 2, 2007
filing date -
Oct 4, 2006
priority date (Note) -
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Abstract
A method for testing an electronics unit, especially an electronics unit of an apparatus for ascertaining and/or monitoring a process variable, wherein the electronics unit has a plurality of electrical components. At least a part of the electrical components is grouped into at least one group, and this group is supplied with a query signal. A response signal is received from the group, and the response signal is evaluated. Furthermore, the invention relates to an apparatus for determining and/or monitoring a process variable.
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