Methods for atomic layer deposition of hafnium-containing high-K dielectric materials

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United States of America Patent

PATENT NO 8282992
APP PUB NO 20080044569A1
SERIAL NO

11925681

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Abstract

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Embodiments of the invention provide methods for depositing materials on substrates during vapor deposition processes, such as atomic layer deposition (ALD). In one embodiment, a chamber contains a substrate support with a receiving surface and a chamber lid containing an expanding channel formed within a thermally insulating material. The chamber further includes at least one conduit coupled to a gas inlet within the expanding channel and positioned to provide a gas flow through the expanding channel in a circular direction, such as a vortex, a helix, a spiral, or derivatives thereof. The expanding channel may be formed directly within the chamber lid or formed within a funnel liner attached thereon. The chamber may contain a retaining ring, an upper process liner, a lower process liner or a slip valve liner. Liners usually have a polished surface finish and contain a thermally insulating material such as fused quartz or ceramic. In an alternative embodiment, a deposition system contains a catalytic water vapor generator connected to an ALD chamber.

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Patent Owner(s)

Patent OwnerAddress
APPLIED MATERIALS INC3050 BOWERS AVENUE SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cho, Kenric Santa Calra, US 1 348
Deaten, Paul San Jose, US 2 906
Kher, Shreyas Campbell, US 13 3572
Metzner, Craig R Fremont, US 19 4487
Myo, Nyi Oo Campbell, US 24 1507
Narwankar, Pravin Sunnyvale, US 21 4260
Poppe, Steve Pleasanton, US 7 974

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