Materials-based failure analysis in design of electronic devices
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United States of America Patent
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Oct 9, 2012
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N/A
app pub date -
Jan 24, 2007
filing date -
Jan 24, 2006
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Abstract
The technology includes methods, a system, and a computer readable medium for predicting the failure of an electronic device during design of the device, by receiving data associated with the device, the data including data indicative of a device response to a specific load on the system while the device is in operation, and predicting potential failure of the device using a probabilistic model and the data, wherein the probabilistic model utilizes at least one of fast probability methods and simulation techniques.
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