Image reconstruction method for high-energy, dual-energy CT system

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United States of America Patent

PATENT NO 8306180
APP PUB NO 20100040192A1
SERIAL NO

12509977

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Abstract

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Disclosed is an image reconstruction method in a high-energy dual-energy CT system. The method comprises steps of scanning an objection with high-energy dual-energy rays to obtain high-energy dual-energy projection values, calculating projection values of base material coefficients corresponding to the dual-energy projection values on the basis of a pre-created lookup table or by analytically solving a set of equations, and obtaining an image of base material coefficient distribution based on the projection values of base material coefficients. The method provides a solution for reconstruction with high-energy dual energy CT technology and thus a more effective approach for substance identification and contraband inspection, thereby bringing a significant improvement on accuracy and efficiency in security inspection.

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Patent Owner(s)

Patent OwnerAddress
TSINGHUA UNIVERSITYQINGHUAYUAN HAIDIAN DISTRICT BEIJING 100084
NUCTECH COMPANY LIMITED2ND FLOOR BLOCK A TONGFANG BUILDING SHUANGQINGLU HAIDIAN DISTRICT BEIJING 100084

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Zhiqiang Beijing, CN 429 2689
Duan, Xinhui Beijing, CN 12 29
Hu, Haifeng Beijing, CN 68 611
Huang, Qingping Beijing, CN 74 221
Kang, Kejun Beijing, CN 78 1276
Li, Yuanjing Beijing, CN 274 2040
Liu, Yinong Beijing, CN 148 1555
Xing, Yuxiang Beijing, CN 55 649
Zhang, Li Beijing, CN 2775 40019

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