Methods for estimating peak location on a sampled surface with improved accuracy and applications to image correlation and registration
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United States of America Patent
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Nov 6, 2012
Grant Date -
Dec 1, 2011
app pub date -
May 25, 2010
filing date -
May 25, 2010
priority date (Note) -
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Abstract
Methods and systems for estimating peak location on a sampled surface (e.g., a correlation surface generated from pixilated images) utilize one or more processing techniques to determine multiple peak location estimates for at least one sampled data set at a resolution smaller than the spacing of the data elements. Estimates selected from the multiple peak location estimates are combined (e.g., a group of estimates is combined by determining a weighted average of the estimates selected for the group) to provide one or more refined estimates. In example embodiments, multiple refined estimates are combined to provide an estimate of overall displacement (e.g., of an image or other sampled data representation of an object).
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