Method for estimating temperature at a critical point
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United States of America Patent
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Nov 6, 2012
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N/A
app pub date -
Oct 13, 2008
filing date -
Oct 13, 2008
priority date (Note) -
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Abstract
Methods and apparatuses are disclosed to estimate temperature at one or more critical points in a data processing system comprising modeling a steady state temperature portion of a thermal model at the one or more critical points using regression analysis; modeling the transient temperature portion of the thermal model at the one or more critical points using a filtering algorithm; and generating a thermal model at the one or more critical points by combining the steady state temperature portion of the thermal model with the transient temperature portion of the thermal model. The thermal model may then be used to estimate an instantaneous temperature at the one or more critical points or to predict a future temperature at the one or more critical points.
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