Magnetic resonance method for quantification of transverse relaxation times

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United States of America Patent

PATENT NO 8314618
APP PUB NO 20110234225A1
SERIAL NO

12732694

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Abstract

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Apparatus and methods for quantification of transverse relaxation times (T2) using steady-state free precession sequences (generally known as fast imaging sequences) and their sensitivity to a quadratic increase of the RF pulse phase, also known as RF spoiling. Using at least two image acquisitions with different partial RF spoiling increments, T2 can be assessed with high precision and with short acquisition times in the limit of large excitation angles being independent on the longitudinal relaxation time (T1) and magnetization transfer effects as compared to other SSFP based quantitative T2 methods. This invention is not restricted to any kind of target and may be applied in 3D as well as in 2D.

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Patent OwnerAddress
UNIVERSITY HOSPITAL OF BASEL4031 BASEL

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bieri, Oliver Liestal, CH 12 86
Scheffler, Klaus Basel, CH 18 180

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