Test apparatus for measuring a characteristic of a device under test

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United States of America Patent

PATENT NO 8319503
SERIAL NO

12590955

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Abstract

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A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.

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Patent Owner(s)

  • CASCADE MICROTECH, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hansen, Mark Hillsboro, US 34 1066
Negishi, Kazuki Hillsboro, US 18 54

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