System and method to measure capacitance of capacitive sensor array
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United States of America Patent
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Nov 27, 2012
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N/A
app pub date -
Sep 26, 2008
filing date -
Sep 26, 2008
priority date (Note) -
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Abstract
A system and method for measuring capacitance of a capacitive sensor array is disclosed. Upon measuring the capacitance, position information with respect to the sensor array may be determined. A column, a first row, and a second row of a capacitive sensor array may be selected. The first row and the second row intersect with the column of the capacitive sensor array. A differential capacitance between the first row and the second row may be measured. The differential capacitance may be utilized in determining a location of an object proximate to the capacitive sensor array.
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