Optical angle of arrival measurement system and method

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United States of America Patent

PATENT NO 8334499
APP PUB NO 20100230577A1
SERIAL NO

12401027

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An optical angle of arrival measurement system uses an optical element to form at least one narrow width line on a focal plane array (FPA) which is oblique with respect to the FPA's row and column axes and which traverses at least two rows or columns along its length; forming two perpendicular narrow width lines in a cross-pattern is preferred. Interpolating the position of the lines on the FPA provides coordinates that can be used to calculate the optical angle of arrival in accordance with θx=A(x)·tan−1(x/f), and θy=B(y)·tan−1(y/f), where f is the focal length of the optical element, and A(x) and B(y) are parameters that account for optical distortion and other imperfections of the system. The resolution δθ of the angle of arrival measurement can be improved to at least δθ˜(d/n)/f, where d is the FPA pixel width and n is the length in pixels of the imaged line.

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Patent Owner(s)

Patent OwnerAddress
TELEDYNE SCIENTIFIC & IMAGING LLC1049 CAMINO DOS RIOS THOUSAND OAKS CA 91360

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ma, Jian Thousand Oaks, US 218 1878
Winker, Bruce K Ventura, US 36 833

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