Measurement of sample reflectance
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United States of America Patent
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Jan 1, 2013
Grant Date -
Dec 31, 2009
app pub date -
Sep 1, 2009
filing date -
Jan 20, 2004
priority date (Note) -
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Abstract
An accessory for a spectrometer for carrying out measurements of specular reflectance of a sample. The accessory is designed so that all components can be located in a housing and the sample can be located horizontally on a top-plate of the housing with the components disposed below the plane of that plate.
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