Method and system for enhanced formulation and visualization rendering

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United States of America Patent

PATENT NO 8345252
APP PUB NO 20090213120A1
SERIAL NO

12401129

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Abstract

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An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.

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Patent Owner(s)

Patent OwnerAddress
X-RITE INC3100 - 44TH STREET S W GRANDVILLE MI 49418

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ellens, Marc S Grand Rapids, US 4 122
Huang, Changbo San Francisco, US 1 83
Nisper, Jon Kenneth Grand Rapids, US 5 155
Richardson, Thomas M Ada, US 5 189

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