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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY	TOKYO

International Classification(s)

• G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Kawanishi, Tetsuya	Tokyo, JP	65	578
Nakajima, Shinya	Tokyo, JP	47	514
Shinada, Satoshi	Tokyo, JP	238	4939

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
January 08, 2013	US,8351047,B2   US8351047B2	GRANTED PATENT AS SECOND PUBLICATION
January 27, 2011	US,20110019199,A1   US20110019199A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8351047

Method for evaluating characteristics of optical modulator having high-precision Mach-Zehnder interferometers

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