Methods and circuits for measuring mutual and self capacitance

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United States of America Patent

PATENT NO 8358142
APP PUB NO 20120043971A1
SERIAL NO

12395462

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Abstract

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A capacitance measurement circuit for measuring self and mutual capacitances may include a first electrode capacitively coupled with a second electrode, a first plurality of switches coupled with the first electrode, and a second plurality of switches coupled with the second electrode, wherein, during a first operation stage, the first plurality of switches is configured to apply a first initial voltage to the first electrode and the second plurality of switches is configured to apply a second initial voltage to the second electrode, and wherein, during a second operation stage, the first plurality of switches is configured to connect the first electrode with a measurement circuit, and the second plurality of switches is configured to connect the second electrode with a constant voltage.

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Patent Owner(s)

Patent OwnerAddress
PARADE TECHNOLOGIES LTD2720 ORCHARD PARKWAY SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maharyta, Andriy Lviv, UA 88 3254

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