Photon transfer curve test time reduction

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United States of America Patent

PATENT NO 8363042
SERIAL NO

11784075

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Abstract

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An improved method for photon transfer curve (PTC) testing in an image sensor is described. A cost and time savings is achieved by reducing the number of frames necessary for measurements to two that are generated by illuminating a first plurality of pixel rows at a first intensity level m1, a second plurality of pixel rows at a second intensity level t2, and so forth up to an nth plurality of pixel rows illuminated at an nth intensity level mn where mn>m2>m1. The resulting image has “n” regions each with a different brightness. The highest intensity level essentially saturates the pixels in the nth region. In one example, a four row exposure and five intensity levels are employed in the illuminator sequence. An intelligent light source is pre-programmable with illumination intensity settings and is synchronized to the image sensor using HSYNC and VSYNC signals, for example.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPHSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
D'onofrio, Giuseppe Boise, US 1 4
Nussbächer, Mark Kirchheim Teck, DE 2 8

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