Imprint alignment method, system and template

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United States of America Patent

PATENT NO 8366434
APP PUB NO 20100278955A1
SERIAL NO

12835181

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Abstract

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Sets of lithographic templates providing improved lithographic alignment are described. The sets include at least two templates. The first template has an array of first geometries and the second template has an array of second geometries. The second geometries correspond to the first geometries and at least one second geometry is intentionally offset from its corresponding first geometry.

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Patent Owner(s)

Patent OwnerAddress
CITIBANK N A388 GREENWICH STREET NEW YORK NY 10013

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Voisin, Ronald D Fremont, US 33 3424

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