Substrate treatment method, coating film removing apparatus, and substrate treatment system

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United States of America Patent

PATENT NO 8366872
APP PUB NO 20110240597A1
SERIAL NO

13161185

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Abstract

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According to the present invention, during the photolithography processing of a substrate, exposure processing is performed immediately after removal of a coating film on the rear surface of the substrate, and a coating film is formed on the rear surface of the substrate immediately after the exposure processing. Thereafter, etching treatment and so on are performed, and a series of these treatment and processing steps are performed a predetermined number of times. The coating film has been formed on the rear surface of the substrate at the time for the etching treatment, so that even if the coating film gets minute scratches, the rear surface of the substrate itself is protected by the coating film and thus never scratched. Further, since the coating film on the rear surface of the substrate is removed immediately before the exposure processing, the rear surface of the substrate can be flat for the exposure processing.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITED3-1 AKASAKA 5-CHOME MINATO-KU TOKYO 1076325 ?1076325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kitano, Junichi Koshi, JP 61 2032
Kyouda, Hideharu Koshi, JP 38 688
Miyahara, Osamu Koshi, JP 38 580
Tsutsumi, Kenji Koshi, JP 35 510

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