Memory elements with voltage overstress protection

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United States of America Patent

PATENT NO 8369175
SERIAL NO

12874152

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Abstract

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Integrated circuits may include memory elements that are provided with voltage overstress protection. One suitable arrangement of a memory cell may include a latch with two cross-coupled inverters. Each of the two cross-coupled inverters may be coupled between first and second power supply lines and may include a transistor with a gate that is connected to a separate power supply line. Another suitable memory cell arrangement may include three cross-coupled circuits. Two of the three circuits may be powered by a first positive power supply line, while the remaining circuit may be powered by a second positive power supply line. These memory cells may be used to provide an elevated positive static control signal and a lowered ground static control signal to a corresponding pass gate. These memory cells may include access transistors and read buffer circuits that are used during read/write operations.

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Patent Owner(s)

Patent OwnerAddress
TAHOE RESEARCH LTDDUBLIN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Andy L San Jose, US 148 4956
Liu, Lin-Shih Fremont, US 26 562
Liu, Ping-Chen Fremont, US 29 462
Perisetty, Srinivas Hyderabad, IN 35 838
Rahim, Irfan Milpitas, US 82 2102

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