System and method for scanning of probe arrays

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8391582
APP PUB NO 20120235016A1
SERIAL NO

13480888

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.

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Patent Owner(s)

Patent OwnerAddress
AFFYMETRIX INCSANTA CLARA CA

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bradbury, David Ipswich, US 30 547
Bukys, Albert K Lexington, US 6 65
DeWeerd, Herman Bedford, US 10 585
DiPaolo, Roger Leominster, US 5 267
Jones, Mark Reading, US 167 3373
Katz, Joel M Stoneham, US 4 37
Ksenia, Oleinik-Ovod Newton, US 1 15
McKenzie, Eric E Malden, US 5 90
Miles, Christopher Acton, US 19 344
Odoy, Patrick J Rowley, US 6 305
Overbeck, James T Hingham, US 2 17
Regan, Thomas P Dover, US 6 267
Schultz, Eric North Andover, US 43 261
Stura, David A North Billerica, US 5 267
Weiner, Nathan K Upton, US 20 718
Woolaver, Tim J Billerica, US 2 17

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