Wafer level contactor
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United States of America Patent
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Mar 19, 2013
Grant Date -
Feb 24, 2011
app pub date -
Aug 18, 2009
filing date -
Aug 18, 2009
priority date (Note) -
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status (Latency Note)
Importance
Abstract
A probe card assembly can include a plurality of probes disposed on a substrate and arranged to contact terminals of a semiconductor wafer. Switches can be disposed on the probe card assembly and provide for selective connection and disconnection of the probes from electrical interconnections on the probe card assembly.
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