Method and apparatus for generating jitter test patterns on a high performance serial bus

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United States of America Patent

PATENT NO 8407535
APP PUB NO 20060209943A1
SERIAL NO

11422301

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Abstract

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The present invention provides a method for generating random jitter test patterns by generating a sequence of maximum-size asynchronous packets according to the P1394b standard and transmitting the sequence to the device under test. The present invention provides a method for generating jitter test patterns by disabling the transmitter data scrambler of the second device; clearing the port_error register of the device under test; and sending a test pattern to said device under test. The present invention provides for a method for generating supply noise test patterns comprising: transmitting a test pattern to the DUT comprising a maximum length asynchronous packet containing alternate 0016 and FF16 bytes.

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Patent Owner(s)

Patent OwnerAddress
APPLE INCONE APPLE PARK WAY CUPERTINO CA 95014

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Whitby-Strevens, Colin Ben Lomond, US 93 1217

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