Cleaning method for a process of liquid immersion lithography

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United States of America Patent

PATENT NO 8409360
APP PUB NO 20110056511A1
SERIAL NO

12662760

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Abstract

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Problem: To provide a cleaning liquid and a cleaning method having excellent leaning capability. In a process of liquid immersion lithography, they can preventing the damage to be caused by the component released from the photoresist to photoexposure devices; the waste treatment is easy; the efficiency in substitution with the cleaning liquid for the medium for liquid immersion lithography is high, and the production cost is reduced not detracting from the throughput in semiconductor production.

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Patent Owner(s)

Patent OwnerAddress
TOKYO OHKA KOGYO CO LTDKANAGAWA KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirano, Tomoyuki Kanagawa, JP 119 1838
Koshiyama, Jun Kanagawa, JP 33 196
Tsuji, Hiromitsu Kanagawa, JP 12 107
Yokoya, Jiro Kanagawa, JP 23 86

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