Composition for formation of resist protection film, and method for formation of resist pattern using the same

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United States of America Patent

PATENT NO 8409781
APP PUB NO 20100040973A1
SERIAL NO

12440784

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Abstract

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Disclosed are: a composition for forming a resist protection film, which shows less damage to a resist film, can form a good, rectangular resist pattern, and can be used regardless of the structure of a resin used in a resist composition; and a method for forming a resist pattern by using the composition. Specifically, disclosed are: a composition for forming a resist protection film, which comprises (a) an alkali-soluble polymer and (b) an ether-based solvent; and a method for forming a resist pattern by using the composition.

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Patent Owner(s)

Patent OwnerAddress
TOKYO OHKA KOGYO CO LTD150 NAKAMARUKO NAKAHARA-KU KAWASAKI-SHI KANAGAWA 211-0012

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishiduka, Keita Kanagawa, JP 29 322
Takayama, Toshikazu Kanagawa, JP 17 374

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