Condition monitoring with automatically generated error templates from log messages and sensor trends based on time semi-intervals

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United States of America Patent

PATENT NO 8423493
APP PUB NO 20100332540A1
SERIAL NO

12756432

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Abstract

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An approach is provided for condition monitoring from log messages and sensor trends based on time semi-intervals. The approach may be applied to machine condition monitoring. Patterns are mined from symbolic interval data that extends previous approaches by allowing semi-intervals and partially ordered patterns. The semi-interval patterns and semi-interval partial order patterns are less restrictive than patterns using Allen's relations. Combinations and adaptations of efficient algorithms from sequential pattern and itemset mining for discovery of semi-interval patterns are described.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS CORPORATION300 NEW JERSEY AVENUE NW WASHINGTON DC 20001

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fradkin, Dmitriy Princeton, US 14 225
Moerchen, Fabian Rocky Hill, US 14 722

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