Method for correcting high-frequency characteristic error of electronic component
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United States of America Patent
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Apr 16, 2013
Grant Date -
Jan 21, 2010
app pub date -
May 29, 2009
filing date -
Nov 30, 2006
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Abstract
An electronic-component high-frequency characteristic error correcting method for allowing a calibration work to be performed on a two-terminal impedance component using the same correction-target measuring system as that used in actual measurement. At least three correction data acquisition samples having different high-frequency characteristics are measured by a reference measuring system and an actual measuring system. An equation for associating the value measured by the actual measuring system with the value measured by the reference measuring system using an error correction coefficient of a transmission line is determined. A given electronic component is measured by the actual measuring system. An estimated high-frequency characteristic value of the electronic component obtained when the electronic component is measured by the reference measuring system is calculated using the determined equation.
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