Plasma etching method and plasma etching apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8425786
APP PUB NO 20110100954A1
SERIAL NO

12700903

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In processing a magnetic film composed for example of Fe, Co or Ni formed on a substrate and a nonvolatile metal containing the same in a vacuum reactor using a plasma generating gas for generating plasma and a gas containing C and O, a power applied to an antenna for generating plasma is time-modulated, wherein the feeding of gas containing C and O to the vacuum reactor is synchronized with the time-modulated antenna power so that the supply of gas containing C and O to the vacuum reactor is suppressed when the antenna power is high and the gas containing C and O is fed to the vacuum reactor when the antenna power is low.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATION17-1 TORANOMON 1-CHOME MINATO-KU TOKYO

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maeda, Kenji Kudamatsu, JP 283 3363
Nishio, Ryoji Kudamatsu, JP 77 1628
Satake, Makoto Kokubunji, JP 32 149
Tetsuka, Tsutomu Kasumigaura, JP 45 823
Usui, Tatehito Kasumigaura, JP 83 1626
Yokogawa, Kenetsu Tsurugashima, JP 101 2349

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