Method of fabricating semiconductor device

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United States of America Patent

PATENT NO 8426285
APP PUB NO 20110076842A1
SERIAL NO

12894424

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Abstract

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An ion implantation is performed to implant ions into a silicon substrate, and a microwave irradiation is performed to irradiate the silicon substrate with microwaves after the ion implantation. After the microwave irradiation, the silicon substrate is transferred to a heat-treatment apparatus, where the silicon substrate is treated with heat by being irradiated with light having a pulse width ranging from 0.1 milliseconds to 100 milliseconds, both inclusive.

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Patent Owner(s)

Patent OwnerAddress
KIOXIA CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aoyama, Tomonori Kanagawa-ken, JP 80 1472
Miyano, Kiyotaka Tokyo, JP 73 1079
Yoshino, Kenichi Oita-ken, JP 58 285

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