Test apparatus
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United States of America Patent
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Apr 23, 2013
Grant Date -
Jan 20, 2011
app pub date -
Jul 16, 2010
filing date -
Jan 23, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
There is provided a test apparatus for testing a device under test, including a signal supply section that supplies a test signal to the device under test via a transmission line, and a comparing and judging section that receives a response signal from the device under test via the transmission line shared with the signal supply section, and judges whether the device under test is acceptable by referring to a comparison result obtained by comparing a signal level of the response signal with a reference level corresponding to a logic pattern of the test signal.
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