Methods and apparatus for single testing stimulus
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United States of America Patent
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Apr 23, 2013
Grant Date -
Mar 8, 2012
app pub date -
Mar 7, 2011
filing date -
Mar 12, 2010
priority date (Note) -
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Abstract
Methods and apparatus useful for improving the performance of testing and diagnostic operations on user circuit designs potentially across multiple phases of the development lifecycle and across multiple implementation technologies are described. As one example, a single testing and diagnostic stimulus source can variously provide test pattern data to different potential instantiations of the user circuit design by supporting and selectively utilizing a number of DUT-facing communication channels.
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