Manufacturing method of semiconductor device

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United States of America Patent

PATENT NO 8431449
SERIAL NO

13078021

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An embodiment is a manufacturing method of a semiconductor device including the steps of forming a first insulating film; forming a first mask over the first insulating film; performing a slimming process on the first mask to form a second mask; performing an etching process on the first insulating film using the second mask to form a second insulating film; forming a first conductive film covering the second insulating film; performing a polishing process on the first conductive film and the second insulating film to form a third insulating film, a source electrode, and a drain electrode having equal thicknesses; forming an oxide semiconductor film over the third insulating film, the source electrode, and the drain electrode; forming a gate insulating film over the oxide semiconductor film; and forming a gate electrode in a region which is over the gate insulating film and overlaps with the third insulating film.

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Patent Owner(s)

  • SEMICONDUCTOR ENERGY LABORATORY CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sasagawa, Shinya Chigasaki, JP 254 4388
Suzawa, Hideomi Atsugi, JP 312 10152

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