Method to prevent surface decomposition of III-V compound semiconductors

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United States of America Patent

PATENT NO 8431476
APP PUB NO 20120309153A1
SERIAL NO

13570980

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Abstract

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A method of preventing surface decomposition of a III-V compound semiconductor is provided. The method includes forming a silicon film having a thickness from 10 Å to 400 Å on a surface of an III-V compound semiconductor. After forming the silicon film onto the surface of the III-V compound semiconductor, a high performance semiconductor device including, for example, a MOSFET, can be formed on the capped/passivated III-V compound semiconductor. During the MOSFET fabrication, a high k dielectric can be formed on the capped/passivated III-V compound semiconductor and thereafter, activated source and drain regions can be formed into the III-V compound semiconductor.

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GLOBALFOUNDRIES INCMAPLES CORPORATE SERVICES LIMITED PO BOX 309 UGLAND HOUSE GRAND CAYMAN KY1-1104

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
de, Souza Joel P Putnam Valley, US 154 1089
Fogel, Keith E Hopewell Junction, US 270 4322
Kiewra, Edward W Verbank, US 48 553
Koester, Steven J Ossining, US 74 1940
Parks, Christopher C Poughkeepsie, US 25 247
Sadana, Devendra K Pleasantville, US 897 10959
Siddiqui, Shahab White Plains, US 67 1281

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