Manufacturing method of SOI substrate

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United States of America Patent

PATENT NO 8432021
SERIAL NO

12786574

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Abstract

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An object is to provide a manufacturing method of an SOI substrate in which a plurality of single crystal semiconductor layers uniform in quality is bonded to a substrate having a larger area than a single crystal silicon substrate. At the time of a heat treatment, uniform heat distribution in single crystal semiconductor substrates is realized by using a tray which has depression portions each with a large depth and is not in contact with the single crystal semiconductor substrate bonded to a base substrate as a tray for supporting the base substrate and holding the single crystal semiconductor substrates. Further, by providing a supporting portion for the base substrate between the depression portions of the tray, a contact area between the tray and the base substrate is reduced.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR ENERGY LABORATORY CO LTDATSUGI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Moriwaka, Tomoaki Isehara, JP 86 900

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