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Abstract

Provided is a test apparatus comprising a synchronization module that operates according to a reference clock and outputs a synchronization signal with a prescribed period, and a test module that operates according to a high-frequency clock with a frequency that is n times a frequency of the reference clock. The test module includes a period emulator that emulates the synchronization signal, a phase shifter that shifts a phase of the high-frequency clock by an amount equal to a result of (i) the product of n and the emulated synchronization phase data by (ii) a period of the reference clock, and a test period generating section that generates a test period pulse signal that transitions at an edge timing of the shifted high-frequency clock and test period phase data indicating a phase difference between the test period signal and an edge timing of the test period pulse signal.

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First Claim