Integrated circuit design and fabrication method by way of detecting and scoring hotspots
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United States of America Patent
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Apr 30, 2013
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app pub date -
Jan 5, 2012
filing date -
Jan 5, 2012
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Abstract
An integrated circuit design and fabrication method includes the following steps. Firstly, an integrated circuit design layout is provided. Then, a first hotspot group and a second hotpot group are searched from the integrated circuit design layout. Then, a hotspot score is acquired according to the first hotspot group, the second hotpot group and a product functionality. If the hotspot score is higher than a criterion, the integrated circuit design layout is corrected according to the first hotspot group and the second hotpot group.
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