Method of manufacturing semiconductor device

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United States of America Patent

PATENT NO 8435828
APP PUB NO 20110171775A1
SERIAL NO

13006034

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of manufacturing a semiconductor device includes forming a first insulating film over an underlying film by plasma polymerization of cyclic siloxane, and forming a second insulating film on the first insulating film by plasma polymerization of the cyclic siloxane continuously, after forming the first insulating film. The deposition rate of the first insulating film is slower than the deposition rate of the second insulating film.

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Patent Owner(s)

Patent OwnerAddress
RENESAS ELECTRONICS CORPORATION2-24 TOYOSU 3-CHOME KOUTOU-KU TOKYO 135-0061

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hayashi, Yoshihiro Kanagawa, JP 277 5483
Kawahara, Jun Kanagawa, JP 89 2415
Ohto, Koichi Kanagawa, JP 38 1328
Usami, Tatsuya Kanagawa, JP 140 2299
Yamamoto, Hironori Kanagawa, JP 91 2210

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