Field effect transistor device and fabrication

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United States of America Patent

PATENT NO 8435878
APP PUB NO 20110241120A1
SERIAL NO

12754917

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Abstract

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A method for forming a field effect transistor (FET) device includes forming a dielectric layer on a substrate, forming a first metal layer on the dielectric layer, removing a portion of the first metal layer to expose a portion of the dielectric layer, forming a second metal layer on the dielectric layer and the first metal layer, and removing a portion of the first metal layer and the second metal layer to define a boundary region between a first FET device and a second FET device.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Guo, Dechao Wappingers Falls, US 273 2783
Han, Shu-Jen Wappingers Falls, US 225 1578
Lin, Chung-Hsun White Plains, US 181 2526
Wang, Yanfeng Beacon, US 142 783

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