Electromagnetic wave detecting element

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 8436442
APP PUB NO 20120187464A1
SERIAL NO

13439890

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Abstract

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The present invention is to provide an electromagnetic wave detecting element that can prevent a decrease in light utilization efficiency at sensor portions. The sensor portions are provided so as to correspond to respective intersection portions of scan lines and signal lines, and have semiconductor layer that generate charges due to electromagnetic waves being irradiated, and at whose electromagnetic wave irradiation surface sides upper electrodes are formed, and at whose electromagnetic wave non-irradiation surface sides lower electrodes are formed. Bias voltage is supplied to the respective upper electrodes via respective contact holes by a common electrode line that is formed further toward an electromagnetic wave downstream side than the semiconductor layer.

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Patent Owner(s)

Patent OwnerAddress
FUJIFILM CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Okada, Yoshihiro Kanagawa, JP 196 2174

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