Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device
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United States of America Patent
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May 7, 2013
Grant Date -
May 26, 2011
app pub date -
Aug 10, 2010
filing date -
Mar 27, 2008
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Provided is a measurement apparatus that measures a signal under measurement, comprising a first oscillation circuit that receives one pulse of the signal under measurement and begins oscillating according to the pulse of the signal under measurement to output a first oscillated signal; a second oscillation circuit that receives one pulse of a reference signal and begins oscillating according to the pulse of the reference signal to output a second oscillated signal having a period that is different from a period of the first oscillated signal; and a first sampling section that samples the first oscillated signal according to a pulse of the second oscillated signal. The first oscillation circuit and the second oscillation circuit each include a control section that selects one pulse; a delay section that delays the pulse; and a loop line that feeds the pulse back to an input terminal of the delay section.
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