Tap with three multiplexers and port enable control output
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United States of America Patent
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May 7, 2013
Grant Date -
Dec 27, 2012
app pub date -
Sep 6, 2012
filing date -
Feb 10, 1998
priority date (Note) -
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Abstract
Functional circuits and cores of circuits are tested on integrated circuits using scan paths. Using parallel scan distributor and collector circuits for these scan paths improves test access of circuits and cores embedded within ICs and reduces the IC's power consumption during scan testing. A controller for the distributor and collector circuits includes a test control register, a test control state machine and a multiplexer. These test circuits can be connected in a hierarchy or in parallel. A conventional test access port or TAP can be modified to work with the disclosed test circuits.
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