Method of trimming a thin film resistor, and an integrated circuit including trimmable thin film resistors
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United States of America Patent
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May 14, 2013
Grant Date -
Apr 26, 2012
app pub date -
Oct 21, 2010
filing date -
Oct 21, 2010
priority date (Note) -
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Abstract
Apparatus and methods of trimming resistors are disclosed. In one embodiment, a method of controlling the PCR of a thin film resistor is provided. The method includes applying a first current to a resistor so as to alter a property of the resistor, and measuring the property of the resistor. Applying the first current and measuring the property of the resistor can be repeated until the PCR of the resistor is within an acceptable tolerance of a desired value for the property of the resistor.
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