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Abstract

Techniques are generally described for selecting input vectors that reduce or minimize leakage current for a plurality of integrated circuits (ICs) with the same design, but that differ due to manufacturing variability. In various embodiments, the techniques include determining at least one starting input vector that reduces leakage current in a respective one of N instances of the ICs, and selecting from the determined at least one starting input vector of each respective one of the N instances, a set R of representative input vectors. Some of the embodiments then use each of the representative input vectors in the set R to determine at least a particular input vector to apply to input terminals of an IC in the plurality of ICs to reduce or minimize leakage current in the IC. Additional variants and embodiments may also be disclosed.

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First Claim