High pressure and high temperature linear swell measurement method
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 21, 2013
Grant Date -
N/A
app pub date -
Sep 3, 2010
filing date -
Sep 3, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method and apparatus for monitoring swelling changes consists of a cylindrical cell assembly (80) capable of withstanding high pressure and high temperature with a wafer holder (48) containing a wafer (42) of solid sample. A sensor rod (56) moves in response to expansion or contraction of the sample wafer (42) and its movement is measured by either an LVDT sensor (66) or a magnetometer (116). Heat is provided via a heater (30) and pressure is controlled via a pressurization inlet (16) or pressurization fluid (68).
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully