Composition for radical polymerization and method of forming pattern using the composition

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United States of America Patent

PATENT NO 8445178
APP PUB NO 20100119976A1
SERIAL NO

12479151

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Abstract

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A composition for radical polymerization includes a photosensitive material, a photoinitiator, a solvent, and a material for adjusting a size of a pattern. A method of forming a pattern using the composition is also disclosed.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bulliard, Xavier Yongin-si, KR 31 350
Choi, Yun-hyuk Seoul, KR 6 88
Lee, Kwang-hee Suwon-si, KR 90 640
Lee, Kwang-sup Daejeon, KR 6 50
Park, Jong-jin Yongin-si, KR 132 1081

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