Frequency characteristics measuring device

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United States of America Patent

PATENT NO 8446144
APP PUB NO 20100259245A1
SERIAL NO

12745685

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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It is possible to provide a frequency characteristics measuring device which can simplify the configuration for performing a measurement and reduce the undue effort required for the measurement.

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Patent Owner(s)

Patent OwnerAddress
ADVANTEST CORPORATION1-6-2 MARUNOUCHI CHIYODA-KU TOKYO 100-0005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aoyama, Satoru Tokyo, JP 9 6
Kuniie, Shinji Tokyo, JP 1 2
Ogino, Yoshimasa Tokyo, JP 1 5

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