Semiconductor integrated circuit device with test circuit and test method therefor
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 21, 2013
Grant Date -
Oct 14, 2010
app pub date -
Nov 21, 2008
filing date -
Nov 21, 2007
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor integrated circuit device includes: a normal output signal counter that counts number of times a normal output signal is output by the circuit under test in response to a preset one of the input signals of the input signal set, in case where a circuit under test repeats processing on each of one or more input signals of an input signal set sequentially, a plural number of times.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully