Test circuit and test method for testing differential input circuit
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United States of America Patent
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May 21, 2013
Grant Date -
Aug 12, 2010
app pub date -
Feb 3, 2010
filing date -
Feb 10, 2009
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A test circuit includes a signal level modifying circuit. The signal level modifying circuit modifies at least one of signal levels of an inverting input signal and a noninverting input signal supplied to a differential input circuit in response to a test signal outputted from a signal output circuit to make a difference between signal levels of the inverting input signal and the noninverting input signal smaller than that in a normal operation. Here, the test signal indicates a test mode in which input/output characteristics of the differential input circuit is tested.
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