Semiconductor device test system having high fidelity tester access fixture (HIFIX) board
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United States of America Patent
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May 21, 2013
Grant Date -
Jan 27, 2011
app pub date -
Oct 17, 2008
filing date -
Dec 10, 2007
priority date (Note) -
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Abstract
A semiconductor device test system is disclosed. The semiconductor device test system extends driver- and comparator-functions acting as important functions of a test header to an external part (e.g., a HIFIX board) of the test header, such that it can double the productivity of a test without upgrading the test header. The semiconductor device test system includes a test header for testing a semiconductor device by a test controller, and a HIFIX board for establishing an electrical connection between the semiconductor device and the test header, and including a Device Under Test (DUT) test unit which processes a read signal generated from the semiconductor device by making one pair with a driver of the test header and transmits the processed read signal to the test header.
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